IWCT 2015 – Program
SESSION 1 – 9.00 - 10.30
Language and process
- George Sherwood. Embedded Functions in Combinatorial Test Designs
- Douglas Hillmer. Introducing Combinatorial Testing in the Organization a Report on a First Attempt
- Itai Segall, Rachel Tzoref-Brill and Aviad Zlotnick. Combining Minimization and Generation for Combinatorial Testing
Coffee break 10.30 - 11.00
SESSION 2 - 11.00 - 12.30
Applications
- Roberto Erick Lopez-Herrejon, Stefan Fischer, Rudolf Ramler and Alexander Egyed. A First Systematic Mapping Study on Combinatorial Interaction Testing for Software Product Lines
- Josip Bozic, Bernhard Garn, Dimitris. E. Simos and Franz Wotawa. Evaluation of the IPO-Family Algorithms for Test Case Generation in Web Security Testing
- Siegmar Züfle and Venkataraman Krishnamoorthy. A process for non-functional combinatorial testing (short)
- Arsalan Javeed and Cemal Yilmaz. Combinatorial Interaction Testing of Tangled Configuration Options (short)
Launch 12.30 - 14.00
SESSION 3 – 14.00 – 15.00
Finding faults and dealing with constraints
- Sergiy Vilkomir and David Anderson. Relationship between Pair-wise and MC/DC Testing: Initial Experimental Results (short)
- Ziyuan Wang and Yuanchao Qi. Why Combinatorial Testing Works: Analyzing Minimal Failure-Causing Schemas in Logic Expressions (short)
- Linbin Yu, Feng Duan, Yu Lei, Raghu N. Kacker and D. Richard Kuhn. Constraint Handling In Combinatorial Test Generation Using Forbidden Tuples
Coffee break 15.00 - 15.30
SESSION 4 – 15.30 – 17.15
Test generation
- Angelo Gargantini and Paolo Vavassori. Using Decision Trees to aid Algorithm Selection in Combinatorial Interaction Test Generation
- Christopher Henard, Mike Papadakis and Yves Le Traon. Flattening or Not of the Combinatorial Interaction Testing Models?(short)
- Feng Duan, Linbin Yu, Yu Lei, Raghu N. Kacker and D. Richard Kuhn. Improving IPOG’s Vertical Growth Based on a Graph Coloring Scheme
- Rick Kuhn, Raghu Kacker, Yu Lei and Jose Torres-Jimenez. Equivalence Class Verification and Oracle-free Testing Using Two-layer Covering Arrays (short)
- Laleh Shikh Gholamhosseinghandehari, Jaganmohan Chandrasekaran, Yu Lei, Raghu Kacker and Richard Kuhn. BEN: A Combinatorial Testing-Based Fault Localization Tool (short)